CARMAR VMM-1510P
With the shape and outlined size specified for precision, it applies to a wide range of applications aiming for coordinate measuring such as mechanics, electricity, gauge and plastic industries
- Camera: Japanese original 1/2” Color CCD Camera
- Magnification of zooming lens: 0.7-4.5X
- TV Total magnification: 30-190X
- Field of view: 7-1.1mm
- Data Resolution: 0.001mm
MICRO．VU
VERTEX 251HC
It can examine entire outlined size automatically, enhancing efficiency and accuracy and minimizing human error.
- Programmable 6:1 or 12:1 zoom lens
- 42-channel lighting system
- Expedient and accurate Z-axle
- Measurement and visual
- Quick servo motor control
- Bearing design of "Monorail Track"
MITUTOYO
SJ-410
A wide range, high-resolution detector can measure a variety of surface feature, and then high-speed printer prints out measurement results.
- Measuring Range/Resolution:
- 800µm/0.01µm
- 80µm/0.001µm
- 8µm/0.0001µm
DIATEST
M1 & sylvac μS233
Two-pedal flexible measuring system of DIATEST applies to eyelet measurement in particular and the aperture measurement required for middle-to-high precision in the lab.
- Measuring Range: Φ0.47—Φ41.1㎜ (Two-point)/ Φ4.75-Φ15 0.6㎜(Three-point)
- Measuring Depth: Up to 2000㎜ above
- Repeat Precision:≦1μm
- linear error:≦1%
BOWERS
IP65
- Range: 2-300 mm(0.080“-12”)
- Three-point measuring at 6-300mm
- Resolution: 0.001mm(0.00005“)
- Blind hold measurement starts from 2-6mm and above/Deep hole measurement at 12.5mm (0.500“) and 6mm above (scalable)
CEDAR
DID-4
- Measuring Range: 0.001-4n.m
- Adjustment Range: 2.0-500（mN.m）
- Error±0.5%
TESA Micro-Hite
plus M 600
Measurement of height, groove, parallel and precision.
- Precision Error: 2+1.5L μm
- Verticality: 7 μm
- Precision: 0.001mm
WILSON
500MRA
Part hardness test (HRC / HRB)
- Hardness Resolution: 0.5 Rockwell unit
- Test Force: 500MRA: 10kgf Preliminary Test Force 60, 100, 150kgf Total test force Test force dwell time: 4 ~ 99 sec.
- Precision: In line with EN-ISO 6508 and ASTM E-18
OIX DELTA Professional
DPO-20000
Handheld XRF analyzer with workstation for mobile benchtop use provides fast, precise analysis of transition and heavy metals, and sensitive measurement of light element content, and also maximizes efficiency for speed testing.
- Analytical Range: Alloy and Mining: Mg and up for Rh/Ag and Al and up for Ta/Au
- Soil: P and higher
- Sensitivity: detect harmful materials<5ppm
- Silicon Drift Detector (SDD) Analyzer
KEYENCE
IM-6120
It can drastically cut down measurement time to 3 seconds and eliminate individual differences. Moreover, we can get data report right away by pressing a bottom.
- Measuring Range:
- Wide field: Ø100x200mm
- High precision: 25x125mm
TOKYO SEIMITSU
RONDCOM 41C
Compact desktop roundness measuring instruments.
Semi-automatic measuring function with specification of measuring height